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D8 DISCOVER

The D8 DISCOVER X-ray diffractometer features a new, pioneering diffractometer design for true plug & play operation, making the instrument ideal for changing needs, multiple user environments and high-end research.

Unrivaled portfolio of sources, optics, stages, and detectors
SNAP-LOCK mounting for fast, high precision exchange of optics
Automatic recognition and configuration of beam path components in real time

Manufacturer	Bruker

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Multi-purpose Solutions

<img decoding="async" class="img-responsive alignnone" title="D8 DISCOVER Multi purpose" src="https://www.bruker.com/fileadmin/_processed_/csm_D8-DISCOVER-XRD2-Detail-Phase-ID-and-Quantification-_3_-850x850_80ae4698d3.jpg" alt="D8 DISCOVER Multi purpose" width="600" height="600" />

D8 DISCOVER Multi purpose

D8 DISCOVER Multi-Purpose X-ray diffraction solution: TWIST TUBE and SNAP-LOCK components for thin film applications. PATHFINDER optics features three beampaths to perfectly adjust the angular resolution to the sample.

<img decoding="async" class="img-responsive alignnone" src="https://www.bruker.com/fileadmin/_processed_/csm_170301-256-850x850_09e90b5c65.jpg" alt="D8 DISCOVER Multi purpose solution" width="600" height="600" />

D8 DISCOVER Multi purpose solution

Multipurpose solution with high brilliance IµS and seamlessly intregrated multi-mode EIGER2 detector with HPC technology for unrivaled flexibility from thin-film analysis to materials research.

Dedicated Solutions

D8 DISCOVER for IP-GID

<img decoding="async" class="img-responsive alignnone" src="https://www.bruker.com/fileadmin/_processed_/csm_D8-DISCOVER-for-ip-GID-850x850_4ac7f92c3e.jpg" alt="D8 DISCOVER for ip-GID" width="600" height="600" />

D8 DISCOVER for ip-GID

State-of-the-art in-plane grazing incidence diffraction (IP-GID) capabilities, this XRD solution perfectly covers the full range of all thin-film analysis applications.

D8 DISCOVER for Stress

<img decoding="async" class="img-responsive alignnone" src="https://www.bruker.com/fileadmin/_processed_/csm_D8-DISCOVER-for-stress-850x850_9bbd3ceb31.jpg" alt="D8 DISCOVER for Stress" width="600" height="600" />

D8 DISCOVER for Stress

Fastest and most flexible residual stress system accommodating large, heavy samples with the speed and mapping capability that only large 2D detectors can provide.

D8 DISCOVER for HTS

<img decoding="async" class="img-responsive alignnone" src="https://www.bruker.com/fileadmin/_processed_/csm_D8-DISCOVER-for-HTS-850x850_ac62a38fc5.jpg" alt="D8 DISCOVER for HTS" width="600" height="600" />

D8 DISCOVER for HTS

High Throughput Screening (HTS) using either reflection or transmission geometry. Unmatched data quality and collection speed.

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Category: X-ray Diffractometer

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