- Perform 3D Imaging for soft or low-Z materials with advanced absorption and innovative phase contrast
- Achieve world-leading resolution at flexible working distances beyond the limits of projection-based micro-CT
- Resolve submicrometer-scaled features for diverse sample sizes
- Extend non-destructive imaging in your lab with an in situ / 4D solution
- Investigate materials in native-like environments over time
- Visualizing cracks in soft composite materials or measuring porosity in steel
- Perform in situ studies by imaging under varying conditions such as tensile, compression, gas, oxidation, wetting and temperature variations
- Image materials that are incompatible with vacuum and charged particle beams
- View into deeply buried microstructures that may be unobservable with 2D surface imaging such as optical microscopy, SEM, and AFM
- Maintain resolution at a distance for in situ imaging experiments, allowing you to study a wide variety of sample sizes and shapes using various in situ apparatus
- Understand the impact of these varying conditions over time with the non-destructive nature of X-rays
Sintered Powder Steel
Non-destructive 3D imaging is crucial for additive manufacturing development. A powder stainless steel sample was laser-sintered and imaged by ZEISS Xradia 520 Versa. From the 3D dataset, the non-sintered solid phase was virtually segmented and volume quantified. XRM also provides ability to do interior tomography and look at virtual cross-sections without damage to the sample. Sample courtesy of NIST.
ZEISS OptiRecon is an implementation of iterative reconstruction, allowing the user the optimal selection of speed or image quality, for the Versa X-ray microscope (XRM). It allows you to achieve the same image quality with about one quarter of the data acquisition time for many samples typically found in the oil and gas, mining and metals industries. Similarly, for many applications where it is currently difficult to achieve good image quality in a familiar data acquisition time, ZEISS OptiRecon can greatly improve results.
ZEISS OptiRecon features a proprietary, efficient implementation that allows you to reconstruct a standard dataset of 1024 x 1024 x 1024 voxels in about three minutes, substantially faster than typical. Normally, iterative reconstruction requires a skilled user and the expertise to fine-tune processing parameters for each dataset. ZEISS OptiRecon has a workflow-based user interface with easy to use parameter tuning that does not require specific expertise in tomographic reconstruction.
Typical new users find they are able to set-up full reconstructions of a standard dataset in fewer than 10 minutes.
Use ZEISS OptiRecon for your digital rock or mineral liberation analyses based on your priority of speed or image quality. ZEISS OptiRecon opens new opportunities for dynamic in situ experimentation at a previously inaccessible temporal resolution.
Increase your sample handling efficiency
Maximize your instrument’s utilization with the optional Autoloader, available for all instruments in the ZEISS Xradia Versa series. Reduce the frequency of user interaction and increase productivity by queueing multiple jobs. Load up to 14 sample stations, which can support up to 70 samples, and set to run overnight, or across multiple days. Unprecedented mechanical stability enables high volume quantitative repetitive scanning of like samples.
In Situ experiments
Push the limits for scientific advancement
ZEISS Xradia Versa provides the industry’s premier 3D imaging solution for the widest variety of in situ rigs, from high pressure flow cells to tension, compression and thermal stages.
To accommodate various types of in situ apparatus, such experiments require samples to be mounted further away from the X-ray source. With traditional microCT systems, this significantly limits the resolution achievable during such measurements. ZEISS X-ray microscopes are uniquely capable of Resolution at a Distance (RaaD) technology, which give the highest fidelity of 3D structural information during in situ imaging.
Wide Field Mode
Flexibly image larger samples
Wide Field Mode (WFM) can be used to image across an extended lateral field of view. The wide lateral field of view can provide 3x larger 3D volume for large samples, or give a higher voxel density for a standard field of view. All Xradia Versa systems are capable of WFM with the 0.4x objective. The Xradia 620 Versa system also features WFM with the 4x objective. In combination with Vertical Stitching, WFM enables you to image larger samples at exceptional resolution.
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