With resolution as fine as 50 nm, Xradia 800 Ultra provides you with insight into microscopic structures and processes previously not accessible with conventional lab-based X-ray technology. Operating with 8 keV X-rays provides excellent penetration and contrast for a wide range of materials, enabling you to observe structures and materials in their natural state.
ZEISS Xradia 800 Ultra delivers reliable internal 3D information otherwise only accessible with destructive methods like cross-sectioning. The large working distance and atmospheric sample environment allow you to perform in situ studies with ease.
- Non-destructive 3D X-ray imaging allows repeated imaging of the same sample allowing direct observation of microstructural evolution
- High resolution down to 50 nm is maintained for imaging of samples within in situ devices
- Automated image alignment for tomographic reconstruction
- Switchable field-of-view ranging from 15 to 60 µm
- Absorption and Zernike phase contrast imaging modes
- Develop, prepare and test your planned synchrotron experiments in your laboratory to make limited availability of synchrotron beam time more efficient
- Now with Scout-and-Scan Control System with an easy workflow-based user interface, ideal for the central imaging lab where users may have a wide variety of experience levels
For advanced materials development: study and predict material properties and evolution. Characterize 3D structures of composite materials, such as fuel cells, polymers and composites. Measure and identify porosity, cracks, phase distribution etc. Material of different densities may be segmented through the use of absorption-contrast imaging.
Oil & gas drilling feasibility studies: perform virtual core analysis to reduce time to results. Nanoscale pore structure measurements for geological samples can now be conducted in a few hours compared to traditional core analysis. Perform flow modeling on the nanoscale to complement submicron imaging with the Versa microscope. Understand geomechanics under load, study the effects of tensile pressure on metals, or analyze ceramics under pressure.
Xradia 800 Ultra offers the ability to visualize the internal structure of biological specimens, such as bone and soft tissue, with resolution down to 50 nm. It offers superior contrast, nanoscale 3D X-ray imaging for a variety of materials such as polymers for drug delivery, tissue samples, and scaffolds for tissue engineering.
Xradia 800 Ultra offers visualization of semiconductor samples for electronics packaging research and development.
Observe deformation and failure of materials under uniaxial compressive load. Study elastic and plastic deformation and determine if the effects are uniform, anisotropic or localized relative to nanostructural features such as voids, struts or interfaces.
Observe deformation and failure of materials under uniaxial tensile load. Understand critical properties like elastic modulus and tensile yield strength and how they relate to the specific nanostructural features of the specimen.
Study isolated deformation and failure events surrounding the indentation site. Understand crack generation and propagation, or delamination of coatings and layered structures.
In situ nanomechanical testing is relevant for a broad range of applications covering both engineered and natural materials.
- High strength alloys
- Biomaterials / biomechanics
- Building materials
- Fibers / composites
The innovative ZEISS Scout-and-ScanTM Control System represents a significant usability and productivity improvement for Xradia Ultra. Scout-and-Scan streamlines sample and scan set-up to boost your productivity with Xradia Ultra.
The workflow-based user interface guides you through the process of aligning the sample, scouting for regions of interest, and setting up 3D scans. Recipes allow you to set up multiple scans of the same sample to image various regions of interest, or to combine different imaging modes. The easy-to-use system is ideal for a central lab-type setting where users may have a wide variety of experience levels.
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.
Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows.