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HomeMicroscopes3D X-ray Microscopy Xradia Context microCT

Xradia Context microCT

Your X-ray System for Today with Assurance for Tomorrow

ZEISS Xradia Context is a large field-of-view, non-destructive 3D X-ray micro-computed tomography system. With a robust stage and flexible software-controlled source/detector positioning, you can image large, heavy (25 kg), and tall samples in their full 3D context, as well as small samples with high resolution and detail.

  • Obtain 3D data on entire intact electronic components, large raw materials samples, or biological specimens.
  • Perform non-destructive failure analysis to identify internal defects without cutting your sample or workpiece.
  • Characterize and quantify performance-defining heterogeneities in your materials, like porosity, cracks, inclusions, defects, or multiple phases.
  • Perform 4D evolutionary studies, through ex situ treatment or in situ sample manipulation.
  • Connect to the ZEISS correlative microscopy environment and perform nondestructive 3D imaging to identify regions of interest for subsequent high resolution 2D or 3D electron microscopy imaging.
Manufacturer

Zeiss

Testing

Micro

 
  • Description
  • Reviews (0)
Description

Highlights

Virtual cutaway view of the interior of an intact catalytic converter
Virtual cutaway view of the interior of an intact catalytic converter

Full context 3D imaging

  • Resolve fine details in their full 3D context, even within a relatively large imaging volume with a high pixel density detector of six megapixels.
  • Maximize geometric magnification with small samples to identify and characterize micron-scale structures with high contrast and clarity.
  • Mount and align your specimens rapidly or expand your system with an optional Autoloader for automated handling and sequential scanning of up to 14 samples.
  • Take advantage of a streamlined acquisition workflow fast exposure times and data reconstruction.
3D rendering and clipping plane of a composite sample with carbon and glass fibers
3D rendering and clipping plane of a composite sample with carbon and glass fibers

Based on proven Xradia platform

  • With Xradia context microCT you benefit of years of development as it is built upon the same base platform as the Xradia Versa series.
  • Profit from a system targeted at ensuring stability, advances in high resolution, high quality data acquisition and reconstruction.
  • The user-friendly Scout-and-Scan control system provides you with an efficient workflow environment.
  • Perform 4D studies to measure changes in the microstructure of materials under varying conditions.
Full field of view imaging of a bear jaw
Full field of view imaging of a bear jaw

Convertible to X-ray microscopy (XRM)

  • As your imaging needs evolve, so should your instrument: Xradia Context now joins the ZEISS X-ray imaging portfolio, benefiting from ZEISS’s ongoing commitment to extend the capabilities and functionality of its systems in the field.
  • This opens up 3D tomographic imaging that’s ready to grow with your needs – Your Xradia Context microCT is the only microCT that can be converted at any time to a ZEISS Xradia 5XX Versa 3D X-ray microscope (XRM).
  • Add the In Situ Interface Kit and load stages to investigate material evolution in 4D.
  • Add FPX (flat panel extension) for flexibility and performance in spatial resolution and advanced contrast and acquisition methods.

Fields of Application

Materials Science, Engineering, Geoscience, and More

Serve a variety of needs in your central or R&D lab today – materials science, engineering, geoscience, life science, and more – and be ready to expand your capabilities when your imaging needs develop. Xradia Context provides 3D imaging for applications in the fields of materials, life and geoscience research, raw materials characterization, and manufacturing and assembly failure analysis and quality control.

Virtual cross section through a cycled and de-packaged lithium ion battery, revealing damage in the current collector and cathode layers.

Virtual cross section through a cycled and de-packaged lithium ion battery, revealing damage in the current collector and cathode layers. Sample courtesy of Prof. D. U. Sauer and Prof. E. Figgemeier, ISEA, RWTH Aachen University

 

3D rendering of results from a rapid scan of a turbine blade to evaluate geometry and inspect for internal defects or cracks.

3D rendering of results from a rapid scan of a turbine blade to evaluate geometry and inspect for internal defects or cracks.

 

3D rendering of a light bulb.

3D rendering of a light bulb. Context can be used to perform full sample scanning to check internal structures or identify defects in manufactured components.

 

Cutaway view of 3D rendering of a mouse embryo embedded in paraffin.

Cutaway view of 3D rendering of a mouse embryo embedded in paraffin. Internal structures are visible with high contrast. Sample courtesy of Massachusetts General Hospital.

 

Virtual cross section through a heterogeneous rock sample revealing multiple phases and porosity.

Virtual cross section through a heterogeneous rock sample revealing multiple phases and porosity.

scout_scan.ts-1569935280079

Software

Create Efficient Workflows by Using The Simple Control System

Easily scout a region of interest and specify scanning parameters within the Scout-and-Scan Control System. Take advantage of the easy-to-use system in your central lab where users may have a variety of experience levels.

Benefit from:

  • Internal camera for sample viewing
  • Recipe control (set, save, recall)
  • Multiple energies
  • Multiple samples with Autoloader option
  • Micropositioning capability with a simple mouse click

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Category: 3D X-ray Microscopy
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VIETNAM INTELLIGENT SERVICE AUTOMATION SOLUTIONS CO., LTD.
(VISAS CO., LTD).
Add: 6 Mac Thai To, Yen Hoa Ward, Cau Giay District, Hanoi, Vietnam.
Hotline : +84 386198984

Email    : info2@visasltd.com

 

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    • Home
    • About Us
    • Products
      • Material testing machineMaterial testing machine
        • Abrasion testing machineAbrasion testing machine
        • Bending testing machineBending testing machine
        • Compression testing machine
        • Folding endurance testing machineFolding endurance testing machine
        • Impact testing machineImpact testing machine
        • PlastimeterPlastimeter
        • Torsion testing machineTorsion testing machine
        • Universal testing machineUniversal testing machine
        • Melt FlowMelt Flow
        • Hardness testerHardness tester
      • MicroscopesMicroscopes
        • 3D optical microscope3D optical microscope
        • 3D X-ray Microscopy3D X-ray Microscopy
        • Atomic force microscopeAtomic force microscope
        • Digital microscopesDigital microscopes
        • Fluorescence MicroscopesFluorescence Microscopes
        • Inverted material science microscopesInverted material science microscopes
        • Measuring microscopesMeasuring microscopes
        • Portable metallographic microscopesPortable metallographic microscopes
        • Stereo microscopesStereo microscopes
        • Upright material science microscopesUpright material science microscopes
      • Elemental analysis equipmentElemental analysis equipment
        • Handheld analyzersHandheld analyzers
        • SpectroscopeSpectroscope
        • X-ray DiffractometerX-ray Diffractometer
      • NDTNDT
        • Magnetic particle imagingMagnetic particle imaging
        • Microscopy cameraMicroscopy camera
        • Tomography equipmentTomography equipment
        • Ultrasonic inspectionUltrasonic inspection
        • X-ray and CT Inspection systemsX-ray and CT Inspection systems
      • High Therm equipmentHigh Therm equipment
        • Induction heatingInduction heating
        • Microwave heatingMicrowave heating
        • Resistance heatingResistance heating
      • Biological equipmentBiological equipment
        • Kit
      • Signal analyzerSignal analyzer
        • Audio analyzerAudio analyzer
        • Network analyzerNetwork analyzer
        • Radio analyzerRadio analyzer
        • Video and image analyzerVideo and image analyzer
      • Semiconductor metrology equipmentSemiconductor metrology equipment
      • Environmental test chambersEnvironmental test chambers
      • Sample preparation equipmentSample preparation equipment
      • AccessoriesAccessories
    • Testing
      • Torsion
      • Compression
      • Flexure
      • Impact
      • Tensile
      • Friction
      • Bending
      • Hardness
      • Micro
      • Surface
      • Elemental Analysis
      • Plasticity
      • Scan
      • Signal Analysis
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      • Stones
      • Signal
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